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Amorphous Silicon under electron impact: in-bulk electron-hole pair formation, and secondary electron emission (SEE)
read2 Replies 266 ViewsVersion 5.3 Low-Frequency ElectromagneticsCharged Particle TracingPlasma Physics
Jonathan Thomet posted 7 years ago reply 7 years ago by Jonathan Thomet
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0 Replies 191 Views
Version 5.3 ElectromagneticsCharged Particle TracingSemiconductor Devices
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0 Replies 76 Views
Version 5.3a MEMS & NanotechnologyMEMS & Piezoelectric DevicesStructural Mechanics
Nabeel Khan posted 7 years ago
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2 Replies 225 Views
Version 5.3a Structural & AcousticsGeometryStructural Mechanics
Rishav Aryal posted 7 years ago reply 7 years ago by Rishav Aryal
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0 Replies 93 Views
General
Lauren Sansone posted 7 years ago
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0 Replies 127 Views
Version 5.3a ChemicalBattery DesignParameters, Variables, & Functions
Daniel Schanbacher posted 7 years ago
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0 Replies 368 Views
Version 5.2a GeneralCluster & Cloud Computing
Aditya Saurabh posted 7 years ago
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2 Replies 201 Views
Vartika Parihar posted 7 years ago reply 7 years ago by Sohan Birla
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Accessing Uplus and Yplus values and also determining Wall shear stress value in a turbulent channel flow.
read0 Replies 668 ViewsVersion 5.0 Computational Fluid Dynamics (CFD)
Lakshmi Narasiman Vijayasarathi posted 7 years ago
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1 Replies 416 Views
Shantharama Bhat posted 7 years ago reply 7 years ago by Mickaël Barsive
