Electron Beam Diverging Due to Self Potential
Application ID: 16045
When modeling the propagation of charged particle beams at high currents, the space charge force generated by the beam significantly affects the trajectories of the charged particles. Perturbations to these trajectories, in turn, affect the space charge distribution.
The Charged Particle Tracing interface can use an iterative procedure to efficiently compute the strongly coupled particle trajectories and electric field for systems operating under steady-state conditions. Such a procedure reduces the required number of model particles by several orders of magnitude, compared to methods based on explicit modeling of Coulomb interactions between the beam particles. A mesh refinement study confirms that the solution agrees with the analytical expression for the shape of a nonrelativistic, paraxial beam envelope.
This model is included as an example in the following products:AC/DCモジュール 粒子追跡モジュール
however additional products may be needed to reproduce it. This example may be created and run using components from the following product combinations:
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