Electron Beam Diverging Due to Self Potential

Application ID: 16045

When modeling the propagation of charged particle beams at high currents, the space charge force generated by the beam significantly affects the trajectories of the charged particles. Perturbations to these trajectories, in turn, affect the space charge distribution.

The Charged Particle Tracing interface can use an iterative procedure to efficiently compute the strongly coupled particle trajectories and electric field for systems operating under steady-state conditions. Such a procedure reduces the required number of model particles by several orders of magnitude, compared to methods based on explicit modeling of Coulomb interactions between the beam particles. A mesh refinement study confirms that the solution agrees with the analytical expression for the shape of a nonrelativistic, paraxial beam envelope.

This model example illustrates applications of this type that would nominally be built using the following products:

AC/DCモジュール 粒子追跡モジュール