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Thin Layer Chronoamperometry

Application ID: 14423


The common electroanalytical method of exhaustive amperometric detection in a microscopic thin layer is modelled as a 1D-symmetric diffusion problem. The simulated result agrees with the analytical Cottrell equation at short times, and deviates as expected at long times when the diffusion layer spans the thin layer cell.

This application was built using the following:

電気化学モジュール

The combination of COMSOL® products required to model your application depends on the physics interfaces that define it. Particular physics interfaces may be common to several products (see the Specification Chart for more details). To determine the right combination of products for your project, you should evaluate all of your needs in light of each product's capabilities, consultation with the COMSOL Sales and Support teams, and the use of an evaluation license.